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An AFM probe is a particular type of SPM probe. AFM probes are manufactured with MEMS technology. Most AFM probes used are made from silicon (Si), but borosilicate glass and silicon nitride are also in use. AFM probes are considered consumables as they are often replaced when the tip apex becomes dull or contaminated or when the cantilever is ...
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [1][2][3] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be ...
The World Leader in Scanning Probes. Website. www .nanosensors .com. Nanosensors Inc. is a company that manufactures probes for use in atomic force microscopes (AFM) and scanning probe microscopes (SPM). This private, for profit company was founded November 21, 2018. Nanosensors Inc. is located in Neuchatel, Switzerland.
NanoAndMore was founded in Germany in 2002 [2] and started operating in the US in 2005. In 2005, NanoWorld Holding AG from Schaffhausen, Switzerland, acquired and integrated NanoAndMore into the NanoWorld group composed of Nanotechnology companies. The world market leader in AFM probes, NanoWorld has appointed NanoAndMore as the official ...
NanoWorld AG. NanoWorld is the global market leader for tips for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The atomic force microscope (AFM) is the defining instrument for the whole field of nanoscience and nanotechnology. It enables its users in research and high-tech industry to investigate materials at the atomic scale.
The colloidal probe consists of a colloidal particle of few micrometers in diameter that is attached to an AFM cantilever. The colloidal probe technique can be used in the sphere-plane or sphere-sphere geometries (see figure). One typically achieves a force resolution between 1 and 100 pN and a distance resolution between 0.5 and 2 nm.
An atomic-force microscope with its controlling computer. AFM-IR (atomic force microscope-infrared spectroscopy) or infrared nanospectroscopy is one of a family of techniques [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15] that are derived from a combination of two parent instrumental techniques. AFM-IR combines the chemical analysis power ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...