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There are several types of X-ray diffractometer, depending on the research field (material sciences, powder diffraction, life sciences, structural biology, etc.) and the experimental environment, if it is a laboratory with its home X-ray source or a Synchrotron. In laboratory, diffractometers are usually an "all in one" equipment, including the ...
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.
X-ray powder diffractometer Bruker D8 Advance at FZU – Institute of Physics of the Czech Academy of Sciences. Laboratory X-ray diffraction equipment relies on the use of an X-ray tube, which is used to produce the X-rays. The most commonly used laboratory X-ray tube uses a copper anode, but cobalt and molybdenum are also popular.
Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
The measurement of the angles can be used to determine crystal structure, see x-ray crystallography for more details. [ 5 ] [ 13 ] As a simple example, Bragg's law, as stated above, can be used to obtain the lattice spacing of a particular cubic system through the following relation:
An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.