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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Nodal analysis uses the concept of a node voltage and considers the node voltages to be the unknown variables. [2]: 2-8 - 2-9 For all nodes, except a chosen reference node, the node voltage is defined as the voltage drop from the node to the reference node. Therefore, there are N-1 node voltages for a circuit with N nodes. [2]: 2-10
In scan-design, registers (flip-flops or latches) in the design are connected in one or more scan chains, which are used to gain access to internal nodes of the chip. Test patterns are shifted in via the scan chain(s), functional clock signals are pulsed to test the circuit during the "capture cycle(s)", and the results are then shifted out to ...
In electrical circuits, ringing is an oscillation of a voltage or current.Ringing can be undesirable because it causes extra current to flow, thereby wasting energy and causing extra heating of the components; it can cause unwanted electromagnetic radiation to be emitted [citation needed]; it can increase settling time for the desired final state; and it may cause unwanted triggering of ...
A Symbolic Analysis of Relay and Switching Circuits is the title of a master's thesis written by computer science pioneer Claude E. Shannon while attending the Massachusetts Institute of Technology (MIT) in 1937, [1] [2] and then published in 1938.
ZVA40 vector network analyzer from Rohde & Schwarz.. A network analyzer is an instrument that measures the network parameters of electrical networks.Today, network analyzers commonly measure s–parameters because reflection and transmission of electrical networks are easy to measure at high frequencies, but there are other network parameter sets such as y-parameters, z-parameters, and h ...
The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector is applied to the circuit, at least one of the output bits will not agree with the corresponding output bit in the test vector.
Switching circuit theory is the mathematical study of the properties of networks of idealized switches. Such networks may be strictly combinational logic, in which their output state is only a function of the present state of their inputs; or may also contain sequential elements, where the present state depends on the present state and past states; in that sense, sequential circuits are said ...