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  2. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  3. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Non-contact mode AFM does not suffer from tip or sample degradation effects that are sometimes observed after taking numerous scans with contact AFM. This makes non-contact AFM preferable to contact AFM for measuring soft samples, e.g. biological samples and organic thin film. In the case of rigid samples, contact and non-contact images may ...

  4. Photoconductive atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Photoconductive_Atomic...

    The non-contact feedback loop is used to control that changes in the oscillations of the cantilever. [37] The application of AFM on non-conducting samples (c-AFM) has in recent years evolved into the modification used for analysis of morphologies on the local scale, particularly morphologies at heterojunctions of multilayered samples.

  5. Near-field scanning optical microscope - Wikipedia

    en.wikipedia.org/wiki/Near-field_scanning...

    In shear force mode and other contact operation it is not conducive for studying soft materials. It has long scan times for large sample areas for high resolution imaging. [citation needed] An additional limitation is the predominant orientation of the polarization state of the interrogating light in the near-field of the scanning tip. Metallic ...

  6. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    SKP has been used to investigate the surface potential of materials used in solar cells, with the advantage that it is a non-contact, and therefore a non-destructive technique. [28] It can be used to determine the electron affinity of different materials in turn allowing the energy level overlap of conduction bands of differing materials to be ...

  7. Magnetic force microscope - Wikipedia

    en.wikipedia.org/wiki/Magnetic_force_microscope

    MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...