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  2. Thin film - Wikipedia

    en.wikipedia.org/wiki/Thin_film

    A thin film is a layer of materials ranging from fractions of a nanometer (monolayer) to several micrometers in thickness. [1] The controlled synthesis of materials as thin films (a process referred to as deposition) is a fundamental step in many applications. A familiar example is the household mirror, which typically has a thin metal coating ...

  3. Thin-film optics - Wikipedia

    en.wikipedia.org/wiki/Thin-film_optics

    Thin-film optics is the branch of optics that deals with very thin structured layers of different materials. [1] In order to exhibit thin-film optics, the thickness of the layers of material must be similar to the coherence length; for visible light it is most often observed between 200 and 1000 nm of thickness.

  4. Thin-film interference - Wikipedia

    en.wikipedia.org/wiki/Thin-film_interference

    The effects of thin-film interference can also be seen in oil slicks and soap bubbles. The reflectance spectrum of a thin-film features distinct oscillations and the extrema of the spectrum can be used to calculate the thickness of the thin-film. [1] Ellipsometry is a technique that is often used to measure properties of thin films. In a ...

  5. Thin-film solar cell - Wikipedia

    en.wikipedia.org/wiki/Thin-film_solar_cell

    Thin-film solar cells are a type of solar cell made by depositing one or more thin layers (thin films or TFs) of photovoltaic material onto a substrate, such as glass, plastic or metal. Thin-film solar cells are typically a few nanometers (nm) to a few microns (μm) thick–much thinner than the wafers used in conventional crystalline silicon ...

  6. Photolithography - Wikipedia

    en.wikipedia.org/wiki/Photolithography

    Photolithography is a subclass of microlithography, the general term for processes that generate patterned thin films. Other technologies in this broader class include the use of steerable electron beams, or more rarely, nanoimprinting, interference, magnetic fields, or scanning probes.

  7. Ellipsometry - Wikipedia

    en.wikipedia.org/wiki/Ellipsometry

    Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model. It can be used to characterize composition, roughness, thickness (depth), crystalline ...

  8. Transparent conducting film - Wikipedia

    en.wikipedia.org/wiki/Transparent_conducting_film

    Transparent conducting films (TCFs) are thin films of optically transparent and electrically conductive material. They are an important component in a number of electronic devices including liquid-crystal displays, OLEDs, touchscreens and photovoltaics. [1][2] While indium tin oxide (ITO) is the most widely used, alternatives include wider ...

  9. Refractive index and extinction coefficient of thin film ...

    en.wikipedia.org/wiki/Refractive_index_and...

    Characterizing thin films. The refractive index (n) and extinction coefficient (k) are related to the interaction between a material and incident light, and are associated with refraction and absorption (respectively). They can be considered as the "fingerprint of the material". Thin film material coatings on various substrates provide ...