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  2. Block-stacking problem - Wikipedia

    en.wikipedia.org/wiki/Block-stacking_problem

    The first nine blocks in the solution to the single-wide block-stacking problem with the overhangs indicated. In statics, the block-stacking problem (sometimes known as The Leaning Tower of Lire (Johnson 1955), also the book-stacking problem, or a number of other similar terms) is a puzzle concerning the stacking of blocks at the edge of a table.

  3. File:Block stacking problem.svg - Wikipedia

    en.wikipedia.org/wiki/File:Block_stacking...

    English: Illustration of the first eight blocks in the solution to the single-wide block-stacking problem by CMG Lee. The wood textures are from File: 16 wood samples.jpg . Date

  4. File:Block stacking problem skintled 4 diamond.svg - Wikipedia

    en.wikipedia.org/wiki/File:Block_stacking...

    What links here; Upload file; Special pages; Printable version; Page information; Get shortened URL

  5. .dwg - Wikipedia

    en.wikipedia.org/wiki/.dwg

    DWG (from drawing) is a proprietary [3] binary file format used for storing two- and three- dimensional design data and metadata.It is the native format for several CAD packages including DraftSight, AutoCAD, ZWCAD, IntelliCAD (and its variants), Caddie and Open Design Alliance compliant applications.

  6. Three-dimensional integrated circuit - Wikipedia

    en.wikipedia.org/wiki/Three-dimensional...

    A three-dimensional integrated circuit (3D IC) is a MOS (metal-oxide semiconductor) integrated circuit (IC) manufactured by stacking as many as 16 or more ICs and interconnecting them vertically using, for instance, through-silicon vias (TSVs) or Cu-Cu connections, [1] [2] so that they behave as a single device to achieve performance ...

  7. Stacking fault - Wikipedia

    en.wikipedia.org/wiki/Stacking_fault

    Comparison of fcc and hcp lattices, explaining the formation of stacking faults in close-packed crystals. In crystallography, a stacking fault is a planar defect that can occur in crystalline materials. [1] [2] Crystalline materials form repeating patterns of layers of atoms. Errors can occur in the sequence of these layers and are known as ...

  8. Multiple patterning - Wikipedia

    en.wikipedia.org/wiki/Multiple_patterning

    The line edge roughness in block copolymer patterns is strongly dependent on the interface tension between the two phases, which in turn, depends on the Flory "chi" (χ) parameter. [74] A higher value of χ is preferred for reduced roughness; the interfacial width between domains is equal to 2a(6χ) −1/2 , where a is the statistical polymer ...

  9. Stacking-fault energy - Wikipedia

    en.wikipedia.org/wiki/Stacking-fault_energy

    The equilibrium width is thus partially determined by the stacking-fault energy. When the SFE is high the dissociation of a full dislocation into two partials is energetically unfavorable, and the material can deform either by dislocation glide or cross-slip. Lower SFE materials display wider stacking faults and have more difficulties for cross ...