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Together, the companies developed the scopemeter, an instrument combining features of an oscilloscope and a multimeter. Fluke purchased the testing and measurements division of Philips in 1993 for $41.8 million. [2] The Philips PM series of measurement instruments was rebranded as Fluke. Fluke was bought by the Danaher Corporation in 1998.
Analog multimeter Digital multimeter. A multimeter (also known as a volt-ohm-milliammeter, volt-ohmmeter or VOM) [1] is a measuring instrument that can measure multiple electrical properties. [2] [3] A typical multimeter can measure voltage, resistance, and current, [4] in which case can be used as a voltmeter, ohmmeter, and ammeter.
Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.
Fluke, a 1977 novel by English horror writer James Herbert Fluke, or, I Know Why the Winged Whale Sings , a 2003 novel by Christopher Moore Fluke Mini-Comics & Zine Festival , a one-day mini-comics, small press, and 'zine festival held annually in Athens, Georgia
An electrical meter with integral AC current clamp is known as a clamp meter, clamp-on ammeter, tong tester, or colloquially as an amp clamp. A clamp meter measures the vector sum of the currents flowing in all the conductors passing through the probe, which depends on the phase relationship of the currents. Only one conductor is normally ...
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The formal definition of calibration by the International Bureau of Weights and Measures (BIPM) is the following: "Operation that, under specified conditions, in a first step, establishes a relation between the quantity values with measurement uncertainties provided by measurement standards and corresponding indications with associated measurement uncertainties (of the calibrated instrument or ...
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.