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A coordinate-measuring machine (CMM) is a device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe. Various types of probes are used in CMMs, the most common being mechanical and laser sensors, though optical and white light sensors do exist.
A CMM is based on CNC technology to automate measurement of Cartesian coordinates using a touch probe, contact scanning probe, or non-contact sensor. Optical comparators are used when physically touching the part is undesirable; components that consist of fragile or mailable materials require measurement using non-contact techniques.
A CMM provides a rapid method for inspecting absolute points, but geometric relationships, such as runout, parallelism, perpendicularity, etc., must be calculated rather than measured directly. By aligning an accurate spindle with an electronic test indicator with a geometric feature of interest, rather than using a non-scanning cartesian probe ...
3D scanning is the process of analyzing a real-world object or environment to collect three dimensional data of its shape and possibly its appearance (e.g. color). The collected data can then be used to construct digital 3D models. A 3D scanner can be based
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
The probe moves in only two axes (the vertical Z and either X or Y horizontal) and the rotating table positions the subject of inspection (a cylindrical part, hence the word "cylindrical" in the title) in a precise manner. The probe may be tactile in nature, or optical. Optical probing methods include laser interferometry and telecentric lensing.
In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height in order to map the work function of the surface. A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller.
A white light scanner (WLS) is a device for performing surface height measurements of an object using coherence scanning interferometry with spectrally-broadband, "white light" illumination. Different configurations of scanning interferometer may be used to measure macroscopic objects with surface profiles measuring in the centimeter range, to ...