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Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
This type of AFM operation is referred to as the force mode. With this probe, one can study interactions between various surfaces and probe particles in the sphere-plane geometry . It is also possible to study forces between colloidal particles by attaching another particle to the substrate and perform the measurement in the sphere-sphere ...
An AFM probe has a sharp tip on the free-swinging end of a cantilever that protrudes from a holder. [29] The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is usually on the scale of a few nanometers to a few tens of nanometers.
Minimum configuration of 1GB RAM and 100 megabytes of free hard disk space, 1.80 GHz or faster 2 cores and x86/x64 compatible architectures. Also compatible with Windows Surface Pro and Surface Pro 2 tablets. AOL Tech Fortress - is not supported on Mac devices or operating systems.
Choosing the optimum defocus is crucial to fully exploit the capabilities of an electron microscope in high resolution transmission electron microscopy mode. However, there is no simple answer as to which one is the best. In Gaussian focus one sets the defocus to zero, the sample is in focus.
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