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A BFM is typically implemented using hardware description languages such as Verilog, VHDL, SystemC, or SystemVerilog. Typically, BFMs offer a two-sided interface: One interface side drives and samples low-level signals according to the bus protocol. On its other side, tasks are available to create and respond to bus transactions.
VHDL source for a signed adder. VHDL (VHSIC Hardware Description Language) is a hardware description language that can model the behavior and structure of digital systems at multiple levels of abstraction, ranging from the system level down to that of logic gates, for design entry, documentation, and verification purposes.
An HDL simulator — the program that executes the testbench — maintains the simulator clock, which is the master reference for all events in the testbench simulation. Events occur only at the instants dictated by the testbench HDL (such as a reset-toggle coded into the testbench), or in reaction (by the model) to stimulus and triggering events.
VHDL-1987,-1993,-2002,-2008, V2001, SV2005, SV2009, SV2012, SV2017: The original Modeltech (VHDL) simulator was the first mixed-language simulator capable of simulating VHDL and Verilog design entities together. In 2003, ModelSim 5.8 was the first simulator to begin supporting features of the Accellera SystemVerilog 3.0 standard. [1]
Using high-level synthesis, also known as ESL synthesis, the allocation of work to clock cycles and across structural components, such as floating-point ALUs, is done by the compiler using an optimisation procedure, whereas with RTL logic synthesis (even from behavioural Verilog or VHDL, where a thread of execution can make multiple reads and ...
A test bench or testing workbench is an environment used to verify the correctness or soundness of a design or model.. The term has its roots [citation needed] in the testing of electronic devices, where an engineer would sit at a lab bench with tools for measurement and manipulation, such as oscilloscopes, multimeters, soldering irons, wire cutters, and so on, and manually verify the ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks.