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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Non-contact mode AFM does not suffer from tip or sample degradation effects that are sometimes observed after taking numerous scans with contact AFM. This makes non-contact AFM preferable to contact AFM for measuring soft samples, e.g. biological samples and organic thin film. In the case of rigid samples, contact and non-contact images may ...
The non-contact feedback loop is used to control that changes in the oscillations of the cantilever. [37] The application of AFM on non-conducting samples (c-AFM) has in recent years evolved into the modification used for analysis of morphologies on the local scale, particularly morphologies at heterojunctions of multilayered samples.
Giessibl is the inventor of the qPlus sensor, [17] [18] a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever. His invention has enabled atomic force microscopy to obtain subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules.
SKP has been used to investigate the surface potential of materials used in solar cells, with the advantage that it is a non-contact, and therefore a non-destructive technique. [28] It can be used to determine the electron affinity of different materials in turn allowing the energy level overlap of conduction bands of differing materials to be ...
Simulating an AFM scansion in contact mode, It has been found that a vacancy or an adatom can be detected only by an atomically sharp tip. Whether in non-contact mode vacancies and adatoms can be distinguished with the so-called frequency modulation technique with a non-atomically sharp tip.
In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime. In this non-contact regime, the electric force gradient causes a shift in the resonance frequency of the cantilever.
Researchers have developed an array of operating modes and methods for Scanning probe microscopy and Atomic Force Microscopy. The use and application of such methods requires SPM or AFM instruments equipped with method-specific SPM or AFM probes. Nanosensors supplies SPM or AFM users worldwide with a range of such method-specific SPM or AFM ...