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  2. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    This occurs at accelerated life tests or high temperatures and is suspected to be caused by surface-state effects. Degradation in pinch-off voltage . This is a common failure mode for gallium arsenide devices operating at high temperature, and primarily stems from semiconductor-metal interactions and degradation of gate metal structures, with ...

  3. Heat sink - Wikipedia

    en.wikipedia.org/wiki/Heat_sink

    The experiments can have a limited range of problems and operating conditions. Simulations can give a prediction of flow phenomena using CFD software for all desired quantities, with high resolution in space and time and virtually any problem and realistic operating conditions. However, if critical, the results may need to be validated. [2]

  4. Computer cooling - Wikipedia

    en.wikipedia.org/wiki/Computer_cooling

    A finned air cooled heatsink with fan clipped onto a CPU, with a smaller passive heatsink without fan in the background A 3-fan heatsink mounted on a video card to maximize cooling efficiency of the GPU and surrounding components Commodore 128DCR computer's switch-mode power supply, with a user-installed 60 mm cooling fan.

  5. Computer fan control - Wikipedia

    en.wikipedia.org/wiki/Computer_fan_control

    Different software is used by different motherboards. There are also third-party programs that work on a variety of motherboards and allow wide customization of fan behavior depending on temperature readings from the motherboard, CPU, and GPU sensors, as well as allowing manual control. Two such programs are SpeedFan [11] and Argus Monitor. [12]

  6. Thermal design power - Wikipedia

    en.wikipedia.org/wiki/Thermal_design_power

    The declared TPDs of these devices range from 65 W to 105 W; the ambient temperature considered by AMD is +42°C, and the case temperatures range from +61.8 °C to +69.3°C, while the case-to-ambient thermal resistances range from 0.189 to 0.420 °C/W.

  7. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.

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  9. Motherboard - Wikipedia

    en.wikipedia.org/wiki/Motherboard

    Inadequate case cooling and elevated temperatures around the CPU socket exacerbate this problem. With top blowers, the motherboard components can be kept under 95 °C (203 °F), effectively doubling the motherboard lifetime. Mid-range and high-end motherboards, on the other hand, use solid capacitors exclusively.