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  2. Teradyne - Wikipedia

    en.wikipedia.org/wiki/Teradyne

    1997 - Teradyne introduces Catalyst, the first System-On-A-Chip test system. 1998 - Teradyne introduces the Integra J750, a test system for high volume test of low-cost devices. 2000 - Teradyne Japan Division announces a new generation of image sensor test systems, the IP-750. 2004 - Teradyne introduces the FLEX family of test systems, for high ...

  3. Eagle Test Systems - Wikipedia

    en.wikipedia.org/wiki/Eagle_Test_Systems

    Eagle Test Systems was founded by Len Foxman and began providing test solutions in 1976. Since October 1, 2003, they have delivered over 600 test systems to more than 60 customers worldwide. Prior to being acquired by Teradyne, global headquarters were located at its manufacturing facility in Buffalo Grove, Illinois .

  4. Standard Test Data Format - Wikipedia

    en.wikipedia.org/wiki/Standard_Test_Data_Format

    It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as Cohu, Roos Instruments, Teradyne, Advantest, SPEA S.p.A, and others. STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data ...

  5. Teradyne Seminars Help Customers Solve Toughest Chip Test ...

    www.aol.com/2013/01/15/teradyne-seminars-help...

    Need help? Call us! 800-290-4726 Login / Join. Mail

  6. Teradyne Seminars Help Customers Solve Toughest Chip Test ...

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    For premium support please call: 800-290-4726 more ways to reach us

  7. Teradyne to Debut New TestStation Systems at SMT Hybrid ...

    www.aol.com/news/2013-04-08-teradyne-to-debut...

    Teradyne to Debut New TestStation Systems at SMT Hybrid Packaging 2013 Conference NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, Inc. (NYS: TER) , a global provider of proven, high quality, PCB ...

  8. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...

  9. Electronic system-level design and verification - Wikipedia

    en.wikipedia.org/wiki/Electronic_system-level...

    The term Electronic System Level or ESL Design was first defined by Gartner Dataquest, an EDA-industry-analysis firm, on February 1, 2001. [1] It is defined in ESL Design and Verification [ 2 ] as: "the utilization of appropriate abstractions in order to increase comprehension about a system, and to enhance the probability of a successful ...