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  2. Teradyne - Wikipedia

    en.wikipedia.org/wiki/Teradyne

    Teradyne grew its semiconductor test business with the addition of Nextest and Eagle Test Systems in 2008, serving the flash memory test market and high-volume analog test market, respectively. That same year, Teradyne entered the disk-drive test market with the internally developed Neptune product, which serves the data-intensive internet and ...

  3. Eagle Test Systems - Wikipedia

    en.wikipedia.org/wiki/Eagle_Test_Systems

    Eagle Test Systems was founded by Len Foxman and began providing test solutions in 1976. Since October 1, 2003, they have delivered over 600 test systems to more than 60 customers worldwide. Prior to being acquired by Teradyne, global headquarters were located at its manufacturing facility in Buffalo Grove, Illinois .

  4. Standard Test Data Format - Wikipedia

    en.wikipedia.org/wiki/Standard_Test_Data_Format

    It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as Cohu, Roos Instruments, Teradyne, Advantest, SPEA S.p.A, and others. STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data ...

  5. Teradyne Seminars Help Customers Solve Toughest Chip Test ...

    www.aol.com/news/2013-01-15-teradyne-seminars...

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  6. Teradyne Presents Innovative Solutions for the Low Cost China ...

    www.aol.com/2013/03/18/teradyne-presents...

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  7. Teradyne to Debut New TestStation Systems at SMT Hybrid ...

    www.aol.com/news/2013-04-08-teradyne-to-debut...

    Teradyne to Debut New TestStation Systems at SMT Hybrid Packaging 2013 Conference NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, Inc. (NYS: TER) , a global provider of proven, high quality, PCB ...

  8. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicola Nicolici and Bashir M. Al-Hashimi (Kindle Edition – Feb 28, 2003) ISBN 978-0-306-48731-6 Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma (Hardcover – Sep 9, 2002) ISBN 978-0780310001

  9. Teradyne Passes This Key Test - AOL

    www.aol.com/2012/04/04/teradyne-passes-this-key-test

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