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Multi-wavelength anomalous diffraction (sometimes Multi-wavelength anomalous dispersion; abbreviated MAD) is a technique used in X-ray crystallography that facilitates the determination of the three-dimensional structure of biological macromolecules (e.g. DNA, drug receptors) via solution of the phase problem.
A powerful solution is the multi-wavelength anomalous dispersion (MAD) method. In this technique, atoms' inner electrons [clarification needed] absorb X-rays of particular wavelengths, and reemit the X-rays after a delay, inducing a phase shift in all of the reflections, known as the anomalous dispersion effect. Analysis of this phase shift ...
Anomalous X-ray scattering (AXRS or XRAS) is a non-destructive determination technique within X-ray diffraction that makes use of the anomalous dispersion that occurs when a wavelength is selected that is in the vicinity of an absorption edge of one of the constituent elements of the sample. It is used in materials research to study nanometer ...
For example, multi-wavelength anomalous dispersion phasing requires that the scattering be recorded at least three (and usually four, for redundancy) wavelengths of the incoming X-ray radiation. A single crystal may degrade too much during the collection of one data set, owing to radiation damage; in such cases, data sets on multiple crystals ...
XPS requires high vacuum (residual gas pressure p ~ 10 −6 Pa) or ultra-high vacuum (p < 10 −7 Pa) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar. When laboratory X-ray sources are used, XPS easily detects all elements except hydrogen and helium.
The RB arriving at detector 2 will have undergone a phase shift of (0.5 × wavelength + 2k) due to one front-surface reflection and two transmissions. The SB arriving at detector 2 will have undergone a (1 × wavelength + 2k) phase shift due to two front-surface reflections, one rear-surface reflection. Therefore, when there is no sample, only ...
A nondispersive infrared sensor (or NDIR sensor) is a simple spectroscopic sensor often used as a gas detector.It is non-dispersive in the fact that no dispersive element (e.g a prism or diffraction grating as is often present in other spectrometers) is used to separate out (like a monochromator) the broadband light into a narrow spectrum suitable for gas sensing.
Mie theory is often applied in laser diffraction analysis to inspect the particle sizing effect. [28] While early computers in the 1970s were only able to compute diffraction data with the more simple Fraunhofer approximation, Mie is widely used since the 1990s and officially recommended for particles below 50 micrometers in guideline ISO 13320 ...