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  2. Profilometer - Wikipedia

    en.wikipedia.org/wiki/Profilometer

    Advantages of contact profilometers include acceptance, surface independence, resolution, it is a direct technique with no modeling required. Most of the world's surface finish standards are written for contact profilometers. To follow the prescribed methodology, this type of profilometer is often required.

  3. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision ...

  4. Mitutoyo - Wikipedia

    en.wikipedia.org/wiki/Mitutoyo

    Mitutoyo America Corporation was formed in 1963 and is headquartered in Aurora, Illinois (just outside Chicago).Mitutoyo America offers the full product line of precision measuring tools, instruments and equipment with a distribution network, training and education classes, software development, and service support to provide a comprehensive metrology organization.

  5. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Eddy-current testing (also commonly seen as eddy current testing and ECT) is one of many electromagnetic testing methods used in nondestructive testing (NDT) making use of electromagnetic induction to detect and characterize surface and sub-surface flaws in conductive materials.

  6. Surface roughness - Wikipedia

    en.wikipedia.org/wiki/Surface_roughness

    Surface roughness, often shortened to roughness, is a component of surface finish (surface texture). It is quantified by the deviations in the direction of the normal vector of a real surface from its ideal form. If these deviations are large, the surface is rough; if they are small, the surface is smooth.

  7. ISO 25178 - Wikipedia

    en.wikipedia.org/wiki/ISO_25178

    Under 25178, industry-specific taxonomies such as roughness vs waviness are replaced by the more general concept of "scale limited surface" and "cut-off" by "nesting index". The new available filters are described in the series of technical specifications included in ISO 16610 .

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