Search results
Results From The WOW.Com Content Network
Showing an AFM artifact arising from a tip with a high radius of curvature with respect to the feature that is to be visualized AFM artifact, steep sample topography. AFM images can also be affected by nonlinearity, hysteresis, [43] and creep of the piezoelectric material and cross-talk between the x, y, z axes that may require software ...
nc-AFM was the first form of AFM to achieve true atomic resolution images, rather than averaging over multiple contacts, both on non-reactive and reactive surfaces. [ 32 ] nc-AFM was the first form of microscopy to achieve subatomic resolution images, initially on tip atoms [ 42 ] and later on single iron adatoms on copper.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [1] [2] [3] By raster scanning in the x,y plane the work function of the sample can be locally mapped for
In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
The instrumentation involved for pc-AFM is very similar to that necessary for traditional AFM or the modified conductive AFM. The main difference between pc-AFM and other types of AFM instruments is the illumination source that is focused through the inverted microscope objective and the neutral density filter that is positioned adjacent to the illumination source.
AFM-IR enables nanoscale infrared spectroscopy, [52] i.e. the ability to obtain infrared absorption spectra from nanoscale regions of a sample. Chemical compositional mapping AFM-IR can also be used to perform chemical imaging or compositional mapping with spatial resolution down to ~10-20 nm, [18] limited only by the radius of the AFM tip. In ...
With AFM, structural morphology is probed using simple tapping or contact modes that utilize van der Waals interactions between tip and sample to maintain a constant probe deflection amplitude (constant force mode) or maintain height while measuring tip deflection (constant height mode).