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A programmable load is a type of test equipment or instrument which emulates DC or AC resistance loads normally required to perform functional tests of batteries, power supplies or solar cells.
Chroma ATE Inc. 致茂電子, is a Taiwanese electronic test and measurement instrumentation company founded in 1984. The company develops and manufactures a range of electronic test and measurement equipment, automated testing equipment (), signal generator, power supplies, and intelligent manufacturing execution systems ().
The Standard Commands for Programmable Instruments (SCPI; often pronounced "skippy") defines a standard for syntax and commands to use in controlling programmable test and measurement devices, such as automatic test equipment and electronic test equipment. [3]
A load bank is a piece of electrical test equipment used to simulate an electrical load, to test an electric power source without connecting it to its normal operating load. [ 1 ] [ 2 ] During testing, adjustment, calibration, or verification procedures, a load bank is connected to the output of a power source, such as an electric generator ...
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.
Any meter will load the circuit under test to some extent. For example, a multimeter using a moving coil movement with full-scale deflection current of 50 microamps (μA), the highest sensitivity commonly available, must draw at least 50 μA from the circuit under test for the meter to reach the top end of its scale. This may load a high ...
The alternating magnetic flux set up by the growler passes through the windings of the armature coil, generating an alternating voltage in the coil. A short in the coil creates a closed circuit that will act like the secondary coil of a transformer, with the growler acting like the primary coil.
I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...