When.com Web Search

  1. Ad

    related to: chroma electronic load tester instructions free pdf images

Search results

  1. Results From The WOW.Com Content Network
  2. Programmable load - Wikipedia

    en.wikipedia.org/wiki/Programmable_load

    A programmable load is a type of test equipment or instrument which emulates DC or AC resistance loads normally required to perform functional tests of batteries, power supplies or solar cells.

  3. Chroma ATE - Wikipedia

    en.wikipedia.org/wiki/Chroma_ATE

    Chroma ATE Inc. 致茂電子, is a Taiwanese electronic test and measurement instrumentation company founded in 1984. The company develops and manufactures a range of electronic test and measurement equipment, automated testing equipment ( ATE ), signal generator, power supplies, and intelligent manufacturing execution systems ( MES ).

  4. Fill device - Wikipedia

    en.wikipedia.org/wiki/Fill_device

    A fill device or key loader is a module used to load cryptographic keys into electronic encryption machines. Fill devices are usually hand held and electronic ones are battery operated. Older mechanical encryption systems, such as rotor machines, were keyed by setting the positions of wheels and plugs from a printed keying list. Electronic ...

  5. Load bank - Wikipedia

    en.wikipedia.org/wiki/Load_bank

    A load bank is a piece of electrical test equipment used to simulate an electrical load, to test an electric power source without connecting it to its normal operating load. [ 1 ] [ 2 ] During testing, adjustment, calibration, or verification procedures, a load bank is connected to the output of a power source, such as an electric generator ...

  6. Multimeter - Wikipedia

    en.wikipedia.org/wiki/Multimeter

    Any meter will load the circuit under test to some extent. For example, a multimeter using a moving coil movement with full-scale deflection current of 50 microamps (μA), the highest sensitivity commonly available, must draw at least 50 μA from the circuit under test for the meter to reach the top end of its scale. This may load a high ...

  7. Source measure unit - Wikipedia

    en.wikipedia.org/wiki/Source_measure_unit

    I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...

  8. Growler (electrical device) - Wikipedia

    en.wikipedia.org/wiki/Growler_(electrical_device)

    to test series and interpoles (commutating) fields from a DC motor; to determine phasing and polarity in multiwinding armatures; to test rotors in rotating frequency changers, as well as in wound rotors; to test shorts between turns in taped coils before installation into an armature or a stator; as a low voltage isolation transformer

  9. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available.