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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    Inside the aberration corrector (hexapole -hexapole type) A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen.

  4. Scanning tunneling microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling_microscope

    A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. [1][2][3] STM senses the surface by using an extremely sharp conducting tip that can ...

  5. Scanning helium ion microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Helium_Ion_Microscope

    SHIM images have a superior depth of field, showing internal structure in enamel tunnels, which appear as black spots in SEM images. [1] A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of ...

  6. Scanning electrochemical microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_electrochemical...

    Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces. [1][2][3][4][5] Initial characterization of the technique was credited to University of Texas electrochemist ...

  7. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    An electron backscatter diffraction pattern of monocrystalline silicon, taken at 20 kV with a field-emission electron source. Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an ...

  8. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution image of magnesium sample. High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [1][2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals ...

  9. Scanning helium microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_helium_microscopy

    By then rastering the sample, an image of the sample can be formed. The scanning helium microscope (SHeM) is a novel form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to ...