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DFT affects and depends on the methods used for test development, test application, and diagnostics. Most tool-supported DFT practiced in the industry today, at least for digital circuits, is predicated on a Structural test paradigm. Structural test makes no direct attempt to determine if the overall functionality of the circuit is correct.
Test compression is a technique used to reduce the time and cost of testing integrated circuits.The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design.
The DFT is (or can be, through appropriate selection of scaling) a unitary transform, i.e., one that preserves energy. The appropriate choice of scaling to achieve unitarity is 1 / N {\displaystyle 1/{\sqrt {N}}} , so that the energy in the physical domain will be the same as the energy in the Fourier domain, i.e., to satisfy Parseval's theorem .
Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.
Density functional theory, a computational quantum mechanical modelling method; Discrete Fourier transform, in mathematics; Deaerating feed tank, in steam plants that propel ships; Design for testing or design for testability, an IC design technique
A fault coverage test passes when at least a specified percentage of all possible faults can be detected. If it does not pass, at least three options are possible. First, the designer can augment or otherwise improve the vector set, perhaps by using a more effective automatic test pattern generation tool. Second, the circuit may be re-defined ...
Research design Utility Potential analysis Between-group design: Experiment that has two or more groups of subjects each being tested by a different testing factor simultaneously: Student's t-test, Analysis of variance, Mann–Whitney U test: Repeated measures design
A useful property of the DFT is that the inverse DFT can be easily expressed in terms of the (forward) DFT, via several well-known "tricks". (For example, in computations, it is often convenient to only implement a fast Fourier transform corresponding to one transform direction and then to get the other transform direction from the first.)