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Fourier transform infrared spectroscopy (FTIR) [1] is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas. An FTIR spectrometer simultaneously collects high-resolution spectral data over a wide spectral range.
Fourier-transform spectroscopy (FTS) is a measurement technique whereby spectra are collected based on measurements of the coherence of a radiative source, using time-domain or space-domain measurements of the radiation, electromagnetic or not.
An interferogram from an FTIR measurement. The horizontal axis is the position of the mirror, and the vertical axis is the amount of light detected. This is the "raw data" which can be Fourier transformed to get the actual spectrum. Fourier transform infrared (FTIR) spectroscopy is a
Diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) [1] is an infrared spectroscopy sampling technique used on powder samples without prior preparation. The sample is added to a sample cup and the data is collected on the bulk sample.
The schematic representation of a nano-FTIR system with a broadband infrared source. Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and scattering-type scanning near-field optical microscopy (s-SNOM).
There are two main approaches to two-dimensional spectroscopy, the Fourier-transform method, in which the data is collected in the time-domain and then Fourier-transformed to obtain a frequency-frequency 2D correlation spectrum, and the frequency domain approach in which all the data is collected directly in the frequency domain.
FTIR mode Sample preparation Schematic diagram Transmission FTIR: Transmission mode is the most widely used FTIR technique in geoscience due to its high analysis speed and cost-efficient characteristics. [4] The sample, either a rock or a mineral, is cut into a block and polished on both sides until a thin (typically 300 to 15 μm) wafer is ...
The spectral resolution of a spectrograph, or, more generally, of a frequency spectrum, is a measure of its ability to resolve features in the electromagnetic spectrum.It is usually denoted by , and is closely related to the resolving power of the spectrograph, defined as =, where is the smallest difference in wavelengths that can be distinguished at a wavelength of .