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A twin boundary is a defect that introduces a plane of mirror symmetry in the ordering of a crystal. For example, in cubic close-packed crystals, the stacking sequence of a twin boundary would be ABCABCBACBA. On planes of single crystals, steps between atomically flat terraces can also be regarded as planar defects.
Although the criterion for deformation twin growth is not entirely understood, it is a tip-controlled phenomenon linked to the interaction between the residual and mobile twin partials at the twin interface; thermodynamically, this involves the elastic energy of the strained lattice, the interface and volume free-energy of the twin, and the ...
In mixed oxidation state materials like magnetite, antiphase domains and antiphase domain boundaries can occur as a result of charge-ordering even though there are no changes in atom locations. [4] For example, the reconstructed magnetite (100) surface contains alternating Fe II pairs and Fe III pairs in the first subsurface layer. [ 4 ]
Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]
In a TEM, bright field imaging is one technique used to identify the location of stacking faults. Typical image of stacking fault is dark with bright fringes near a low-angle grain boundary, sandwiched by dislocations at the end of the stacking fault. Fringes indicate that the stacking fault is at an incline with respect to the viewing plane. [3]
Garbe et al. [19] have introduced a multi-stage anomaly detection framework that improves upon traditional methods by incorporating spatial clustering, density-based clustering, and locality-sensitive hashing. This tailored approach is designed to better handle the vast and varied nature of IoT data, thereby enhancing security and operational ...
Gray-box testing is beneficial because it takes the straightforward technique of black-box testing and combines it with the code-targeted systems in white-box testing. Gray-box testing is based on requirement test case generation because it presents all the conditions before the program is tested by using the assertion method.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.