When.com Web Search

Search results

  1. Results From The WOW.Com Content Network
  2. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    Equivalent faults produce the same faulty behavior for all input patterns. Any single fault from the set of equivalent faults can represent the whole set. In this case, much less than k×n fault tests are required for a circuit with n signal line. Removing equivalent faults from entire set of faults is called fault collapsing.

  3. Fault detection and isolation - Wikipedia

    en.wikipedia.org/wiki/Fault_detection_and_isolation

    Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...

  4. Failure mode, effects, and criticality analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_Mode,_Effects,_and...

    Fault detection coverage that system built-in test will realize; Whether the analysis will be functional or piece-part; Criteria to be considered (mission abort, safety, maintenance, etc.) System for uniquely identifying parts or functions; Severity category definitions

  5. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.

  6. Fault tree analysis - Wikipedia

    en.wikipedia.org/wiki/Fault_tree_analysis

    A fault tree diagram. Fault tree analysis (FTA) is a type of failure analysis in which an undesired state of a system is examined. This analysis method is mainly used in safety engineering and reliability engineering to understand how systems can fail, to identify the best ways to reduce risk and to determine (or get a feeling for) event rates of a safety accident or a particular system level ...

  7. Iddq testing - Wikipedia

    en.wikipedia.org/wiki/Iddq_testing

    Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values).

  8. Fault coverage - Wikipedia

    en.wikipedia.org/wiki/Fault_coverage

    A fault coverage test passes when at least a specified percentage of all possible faults can be detected. If it does not pass, at least three options are possible. First, the designer can augment or otherwise improve the vector set, perhaps by using a more effective automatic test pattern generation tool. Second, the circuit may be re-defined ...

  9. Failure analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_analysis

    Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective actions or liability.. According to Bloch and Geitner, ”machinery failures reveal a reaction chain of cause and effect… usually a deficiency commonly referred to as the symptom…”