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1997 - Teradyne creates the J973, the first Structural to Functional test system with the ability to shift in real time. 1997 - Teradyne introduces Catalyst, the first System-On-A-Chip test system. 1998 - Teradyne introduces the Integra J750, a test system for high volume test of low-cost devices.
In 2001, Teradyne acquired the GenRad board test system lines, which were relocated to Teradyne's corporate campus in North Reading, Massachusetts. [1]: 240–241 Among General Radio's accomplishments over the years have been: The introduction of one of the world's first portable oscilloscopes.
Eagle Test Systems was founded by Len Foxman and began providing test solutions in 1976. Since October 1, 2003, they have delivered over 600 test systems to more than 60 customers worldwide. Prior to being acquired by Teradyne, global headquarters were located at its manufacturing facility in Buffalo Grove, Illinois .
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The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
After WPT, all individual integrated circuits on the wafer are given extensive wafer functional testing (WFT) (also called die sort) by applying special test patterns. The testers used for WFT are typically quite expensive (see Teradyne for an example of a semiconductor test system). The WFT "yield" is recognized as the key test in determining ...