Search results
Results From The WOW.Com Content Network
Reliability prediction can be used to size spare populations. Provide necessary input to system-level reliability models. System-level reliability models can subsequently be used to predict, for example, frequency of system outages in steady-state, frequency of system outages during early life, expected downtime per year, and system availability.
Reliability engineering is a sub-discipline of systems engineering that emphasizes the ability of equipment to function without failure. Reliability is defined as the probability that a product, system, or service will perform its intended function adequately for a specified period of time, OR will operate in a defined environment without failure. [1]
The Institute of Electrical and Electronics Engineers (IEEE) [a] is an American 501(c)(3) professional association for electrical engineering, electronics engineering, and other related disciplines. The IEEE has a corporate office in New York City and an operations center in Piscataway, New Jersey.
For databases reliability, availability, scalability and recoverability (RASR), is an important concept. Atomicity, consistency, isolation (sometimes integrity), durability is a transaction metric. When dealing with safety-critical systems, the acronym reliability, availability, maintainability and safety is frequently used.
The System Average Interruption Duration Index (SAIDI) [1] is commonly used as a reliability index by electric power utilities.SAIDI is the average cumulative outage duration for each customer served, and is calculated as:
Reliability, availability and serviceability (RAS), also known as reliability, availability, and maintainability (RAM), is a computer hardware engineering term involving reliability engineering, high availability, and serviceability design. The phrase was originally used by IBM as a term to describe the robustness of their mainframe computers.
Reliability index is an attempt to quantitatively assess the reliability of a system using a single numerical value. [1] The set of reliability indices varies depending on the field of engineering, multiple different indices may be used to characterize a single system.
Reliability of a semiconductor device is the ability of the device to perform its intended function during the life of the device in the field. There are multiple considerations that need to be accounted for when developing reliable semiconductor devices: