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Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs, a type of transistor aging.NBTI manifests as an increase in the threshold voltage and consequent decrease in drain current and transconductance of a MOSFET.
Signoff checks have become more complex as VLSI designs approach 22nm and below process nodes, because of the increased impact of previously ignored (or more crudely approximated) second-order effects. There are several categories of signoff checks.
Very-large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining millions or billions of MOS transistors onto a single chip. VLSI began in the 1970s when MOS integrated circuit (metal oxide semiconductor) chips were developed and then widely adopted, enabling complex semiconductor and telecommunications technologies.
The ESPRESSO logic minimizer is a computer program using heuristic and specific algorithms for efficiently reducing the complexity of digital logic gate circuits. [1] ESPRESSO-I was originally developed at IBM by Robert K. Brayton et al. in 1982.
Yield Insight - Yield analysis program which looks at foundry and performance data to diagnose possible problems; HDL Designer Series; Through Solido Design Automation Acquisition Solido Variation Designer - variation-aware design of custom integrated circuits Fast PVT—verify against process, voltage, and temperature corners
In the 1970s and 1980s NMOS was favored owing to speed and area advantages, coupled with technology limitations and concerns related to isolation, parasitic effects and process complexity. During that era of NMOS-dominated LSI and the emergence of VLSI, the fundamental scaling laws of MOS technology were codified and broadly applied. [6]
The common understanding of DFT in the context of electronic design automation (EDA) for modern microelectronics is shaped to a large extent by the capabilities of commercial DFT software tools as well as by the expertise and experience of a professional community of DFT engineers researching, developing, and using such tools. Much of the ...
When the input value A changes from low to high, the circuit outputs a short spike of duration (∆t 1 + ∆t 2) − ∆t 2 = ∆t 1. A race condition or race hazard is the condition of an electronics , software , or other system where the system's substantive behavior is dependent on the sequence or timing of other uncontrollable events ...