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The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...
The characterization of mechanical properties in polymers typically refers to a measure of the strength, elasticity, viscoelasticity, and anisotropy of a polymeric material. The mechanical properties of a polymer are strongly dependent upon the Van der Waals interactions of the polymer chains, and the ability of the chains to elongate and align ...
Characterization is the way materials scientists examine the structure of a material. This involves methods such as diffraction with X-rays , electrons or neutrons , and various forms of spectroscopy and chemical analysis such as Raman spectroscopy , energy-dispersive spectroscopy , chromatography , thermal analysis , electron microscope ...
Solid-state chemistry, also sometimes referred as materials chemistry, is the study of the synthesis, structure, and properties of solid phase materials.It therefore has a strong overlap with solid-state physics, mineralogy, crystallography, ceramics, metallurgy, thermodynamics, materials science and electronics with a focus on the synthesis of novel materials and their characterization.
Materials Science and Engineering – An Introduction. London: John Wiley and Sons. ISBN 0-471-32013-7. Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press. ISBN 978-0-521-83199-4
The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles.,. [1] Nanoparticles measure less than 100 nanometers in at least one of their external dimensions, and are often engineered for their unique properties.
Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.
Thermomechanical analysis (TMA) is a technique used in thermal analysis, a branch of materials science which studies the properties of materials as they change with temperature. Thermomechanical analysis is a subdiscipline of the thermomechanometry (TM) technique.