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The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...
Many of the analytical techniques used to determine the molecular structure of unknown organic compounds are also used in polymer characterization. Spectroscopic techniques such as ultraviolet-visible spectroscopy, infrared spectroscopy, Raman spectroscopy, nuclear magnetic resonance spectroscopy, electron spin resonance spectroscopy, X-ray ...
Characterization or characterisation is the representation of characters (persons, creatures, or other beings) in narrative and dramatic works. The term character development is sometimes used as a synonym .
Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
DE(T)A – Dielectric thermal analysis dHvA – De Haas–van Alphen effect DIC – Differential interference contrast microscopy Dielectric spectroscopy; DLS – Dynamic light scattering
Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [2] An instrument dedicated to performing such powder measurements is called a powder diffractometer.
X-ray photoelectron spectroscopy (XPS) and Energy-dispersive X-ray spectroscopy (EDS/EDX) are composition characterization techniques that use x-ray excitation of electrons to discrete energy levels to quantify chemical composition. These techniques provide characterization at surface depths of 1–10 nanometers, approximately the range of ...