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A twin boundary is a defect that introduces a plane of mirror symmetry in the ordering of a crystal. For example, in cubic close-packed crystals, the stacking sequence of a twin boundary would be ABCABCBACBA. On planes of single crystals, steps between atomically flat terraces can also be regarded as planar defects.
Anomaly detection for IDS is normally accomplished with thresholds and statistics, but can also be done with soft computing, and inductive learning. [7] Types of features proposed by 1999 included profiles of users, workstations, networks, remote hosts, groups of users, and programs based on frequencies, means, variances, covariances, and ...
A twin law is not a symmetry operation of the full set of basis points. [2] Twin laws include reflection operations, rotation operations, and the inversion operation. Reflection twinning is described by the Miller indices of the twin plane (i.e. {hkl}) while rotational twinning is described by the direction of the twin axis (i.e. <hkl ...
For a rotating machine, the rotational speed of the machine (often known as the RPM), is not a constant, especially not during the start-up and shutdown stages of the machine. Even if the machine is running in the steady state, the rotational speed will vary around a steady-state mean value, and this variation depends on load and other factors.
In machine learning (ML), feature learning or representation learning [2] is a set of techniques that allow a system to automatically discover the representations needed for feature detection or classification from raw data. This replaces manual feature engineering and allows a machine to both learn the features and use them to perform a ...
In mixed oxidation state materials like magnetite, antiphase domains and antiphase domain boundaries can occur as a result of charge-ordering even though there are no changes in atom locations. [4] For example, the reconstructed magnetite (100) surface contains alternating Fe II pairs and Fe III pairs in the first subsurface layer. [ 4 ]
An Automated Optical Inspection device. Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew).
In anomaly detection, the local outlier factor (LOF) is an algorithm proposed by Markus M. Breunig, Hans-Peter Kriegel, Raymond T. Ng and Jörg Sander in 2000 for finding anomalous data points by measuring the local deviation of a given data point with respect to its neighbours.