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  2. MIL-STD-883 - Wikipedia

    en.wikipedia.org/wiki/MIL-STD-883

    The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and ...

  3. United States Military Standard - Wikipedia

    en.wikipedia.org/wiki/United_States_Military...

    MIL-STD-810, test methods for determining the environmental effects on equipment [24] MIL-STD-882, standard practice for system safety [25] MIL-STD-883, test method standard for microcircuits [26] MIL-STD-1168, a classification system for ammunition production that replaced the Ammunition Identification Code (AIC) system used during World War II.

  4. Environmental stress screening - Wikipedia

    en.wikipedia.org/wiki/Environmental_stress_screening

    "mil-std-781d, military standard, reliability testing for engineering development, qualification, and production (s/s by mil-hdbk-781a)" (pdf). united states department of defense. 17 oct 1986. "mil-std-810g, department of defense test method standard, environmental engineering considerations and laboratory tests" (pdf).

  5. Flatpack (electronics) - Wikipedia

    en.wikipedia.org/wiki/Flatpack_(electronics)

    The test procedures of these requirements are found in MIL-STD-883 (Test Methods and Procedures for Microelectronics) as a listing of test methods. These methods cover various aspects of the minimum requirements that a microelectronics device must be able to attain before it is considered a compliant device.

  6. Category:Military of the United States standards - Wikipedia

    en.wikipedia.org/wiki/Category:Military_of_the...

    It is preferred that articles in this category be listed by publishing identifier (MIL-STD-####) for consistency. Pages in category "Military of the United States standards" The following 46 pages are in this category, out of 46 total.

  7. PIND - Wikipedia

    en.wikipedia.org/wiki/PIND

    According to method 2020.9 of MIL-STD-883 and method 2052.5 of MIL-STD-750, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer .

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  9. MIL-PRF-38535 - Wikipedia

    en.wikipedia.org/wiki/MIL-PRF-38535

    For QML microcircuits the manufacturer developed a program plan that meets the performance detailed in these appendices. Appendix A is mandatory for manufacturers of device types supplied in compliance with MIL-STD-883 and forms the basis for QML classes Q and V. Appendix B is intended for space application and is required for V level devices ...