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  2. Diffraction-limited system - Wikipedia

    en.wikipedia.org/wiki/Diffraction-limited_system

    For example, an electron at an energy of 10 keV has a wavelength of 0.01 nm, allowing the electron microscope (SEM or TEM) to achieve high resolution images. Other massive particles such as helium, neon, and gallium ions have been used to produce images at resolutions beyond what can be attained with visible light.

  3. Resolution (structural biology) - Wikipedia

    en.wikipedia.org/wiki/Resolution_(structural...

    In structural biology, resolution can be broken down into 4 groups: (1) sub-atomic, when information about the electron density is obtained and quantum effects can be studied, (2) atomic, individual atoms are visible and an accurate three-dimensional model can be constructed, (3) helical, secondary structure, such as alpha helices and beta sheets; RNA helices (in ribosomes), (4) domain, no ...

  4. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. [1] Electron microscope may refer to: Transmission electron microscopy (TEM) where swift electrons go through a thin sample

  5. Contrast transfer function - Wikipedia

    en.wikipedia.org/wiki/Contrast_transfer_function

    The effect of the contrast transfer function can be seen in the alternating light and dark rings (Thon rings), which show the relation between contrast and spatial frequency. The contrast transfer function (CTF) mathematically describes how aberrations in a transmission electron microscope (TEM) modify the image of a sample.

  6. Scherzer's theorem - Wikipedia

    en.wikipedia.org/wiki/Scherzer's_theorem

    Scherzer's theorem is a theorem in the field of electron microscopy. It states that there is a limit of resolution for electronic lenses because of unavoidable aberrations. German physicist Otto Scherzer found in 1936 [1] that the electromagnetic lenses, which are used in electron microscopes to focus the electron beam, entail unavoidable ...

  7. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...

  8. Aberration-Corrected Transmission Electron Microscopy

    en.wikipedia.org/wiki/Aberration-Corrected...

    Scherzer's theorem is a theorem in the field of electron microscopy. It states that there is a limit of resolution for electronic lenses because of unavoidable aberrations. German physicist Otto Scherzer found in 1936 [1] that the electromagnetic lenses, which are used in electron microscopes to focus the electron beam, entail unavoidable ...

  9. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...