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An AFM probe has a sharp tip on the free-swinging end of a cantilever that protrudes from a holder. [29] The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is usually on the scale of a few nanometers to a few tens of nanometers.
In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
This type of AFM operation is referred to as the force mode. With this probe, one can study interactions between various surfaces and probe particles in the sphere-plane geometry . It is also possible to study forces between colloidal particles by attaching another particle to the substrate and perform the measurement in the sphere-sphere ...
Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. In materials science, chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.
Market research [5] and industry experts [6] confirm that NanoWorld today is the global market leader for AFM probes for scanning probe microscopy (SPM) and atomic force microscopy (AFM). NanoWorld's unique selling proposition is the consistent quality of its AFM probes which is essential for reproducible imaging by atomic force microscope.
A common form of electric force microscopy involves a noncontact AFM mode of operation. In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime.