When.com Web Search

Search results

  1. Results From The WOW.Com Content Network
  2. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector is applied to the circuit, at least one of the output bits will not agree with the corresponding output bit in the test vector.

  3. pytest - Wikipedia

    en.wikipedia.org/wiki/Pytest

    It is a common pattern in software testing to send values through test functions and check for correct output. In many cases, in order to thoroughly test functionalities, one needs to test multiple sets of input/output, and writing such cases separately would cause duplicate code as most of the actions would remain the same, only differing in input/output values.

  4. Switch statement - Wikipedia

    en.wikipedia.org/wiki/Switch_statement

    Switch expressions are introduced in Java SE 12, 19 March 2019, as a preview feature. Here a whole switch expression can be used to return a value. There is also a new form of case label, case L-> where the right-hand-side is a single expression. This also prevents fall through and requires that cases are exhaustive.

  5. Ringing (signal) - Wikipedia

    en.wikipedia.org/wiki/Ringing_(signal)

    In electrical circuits, ringing is an oscillation of a voltage or current.Ringing can be undesirable because it causes extra current to flow, thereby wasting energy and causing extra heating of the components; it can cause unwanted electromagnetic radiation to be emitted [citation needed]; it can increase settling time for the desired final state; and it may cause unwanted triggering of ...

  6. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  7. Circuit breaker design pattern - Wikipedia

    en.wikipedia.org/wiki/Circuit_breaker_design_pattern

    The Circuit Breaker is a design pattern commonly used in software development to improve system resilience and fault tolerance. Circuit breaker pattern can prevent cascading failures particularly in distributed systems. [1] In distributed systems, the Circuit Breaker pattern can be used to monitor service health and can detect failures dynamically.

  8. Punctured code - Wikipedia

    en.wikipedia.org/wiki/Punctured_code

    This has the same effect as encoding with an error-correction code with a higher rate, or less redundancy. However, with puncturing the same decoder can be used regardless of how many bits have been punctured, thus puncturing considerably increases the flexibility of the system without significantly increasing its complexity.

  9. Barker code - Wikipedia

    en.wikipedia.org/wiki/Barker_code

    A Barker code has a maximum autocorrelation sequence which has sidelobes no larger than 1. It is generally accepted that no other perfect binary phase codes exist. [9] [10] (It has been proven that there are no further odd-length codes, [11] nor even-length codes of N < 10 22. [12])