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Multiple probe designs may be useful in identifying extraneous factors which may be influencing your results. Lastly, experimenters should avoid gathering data during sessions alone. If in-session data is gathered a note of the dates should be tagged to each measurement in order to provide an accurate time-line for potential reviewers.
DFT techniques have been used at least since the early days of electric/electronic data processing equipment. Early examples from the 1940s/50s are the switches and instruments that allowed an engineer to "scan" (i.e., selectively probe) the voltage/current at some internal nodes in an analog computer [analog scan].
Four-point measurement of resistance between voltage sense connections 2 and 3. Current is supplied via force connections 1 and 4. In electrical engineering, four-terminal sensing (4T sensing), 4-wire sensing, or 4-point probes method is an electrical impedance measuring technique that uses separate pairs of current-carrying and voltage-sensing electrodes to make more accurate measurements ...
The instruments may include device power supplies (DPS), [1] [2] parametric measurement units (PMU), arbitrary waveform generators (AWG), digitizers, digital IOs, and utility supplies. The instruments perform different measurements on the DUT, and the instruments are synchronized so that they source and measure waveforms at the proper times.
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes.
Repeated measures design is a research design that involves multiple measures of the same variable taken on the same or matched subjects either under different conditions or over two or more time periods. [1] For instance, repeated measurements are collected in a longitudinal study in which change over time is assessed.
A condition is shown to affect a decision's outcome independently by varying just that condition while holding fixed all other possible conditions. The condition/decision criterion does not guarantee the coverage of all conditions in the module because in many test cases, some conditions of a decision are masked by the other conditions. Using ...
Advanced Tester Resource Enhancement (ATRE) [5] is a powerful means of increasing the number of DUTs that can be tested by a probe card in parallel (or in one touchdown during which probe card needles remain in contact with the wafer DUTs). ATRE allows the sharing of tester resources among DUTs using active components, which have the ability to ...