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Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
The Zwick Roell Group is a manufacturer of static testing machines and systems for materials and components testing used to evaluate the mechanical and physical properties and performance of materials and components.
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
A universal testing machine (Hegewald & Peschke) The most common testing machine used in tensile testing is the universal testing machine. This type of machine has two crossheads; one is adjusted for the length of the specimen and the other is driven to apply tension to the test specimen. Testing machines are either electromechanical or ...
Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.
The first member, the CDC 3600, was a 48-bit system introduced in 1963. The same basic design led to the cut-down CDC 3400 of 1964, and then the 24-bit CDC 3300, 3200 and 3100 introduced between 1964 and 1965. [1] The 3000 series replaced the earlier CDC 1604 and CDC 924 systems. [2] The line was a great success and became CDC's cash cow ...
A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...
The Vickers hardness test was developed in 1921 by Robert L. Smith and George E. Sandland at Vickers Ltd as an alternative to the Brinell method to measure the hardness of materials. [1] The Vickers test is often easier to use than other hardness tests since the required calculations are independent of the size of the indenter, and the indenter ...