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529 Site is overloaded Used by Qualys in the SSLLabs server testing API to signal that the site can not process the request. [39] 530 Site is frozen Used by the Pantheon Systems web platform to indicate a site that has been frozen due to inactivity. [40] 530 Origin DNS Error
Figure 2. The Set–Reset NOR latch example. A simple example of metastability can be found in an SR NOR latch, when both Set and Reset inputs are true (R=1 and S=1) and then both transition to false (R=0 and S=0) at about the same time.
The difference is that NAND logical gates are used in the gated D latch, while SR NAND latches are used in the positive-edge-triggered D flip-flop. The role of these latches is to "lock" the active output producing low voltage (a logical zero); thus the positive-edge-triggered D flip-flop can also be thought of as a gated D latch with latched ...
Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.
Phrases used by the tech savvy to mean that a problem is caused entirely by the fault of the user include PEBKAC [8] (an acronym for "problem exists between keyboard and chair"), PEBCAK [9] (an alternative, but similar, acronym for "problem exists between chair and keyboard"), POBCAK (a US government/military acronym for "problem occurs between ...
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The number of tests required based on the source code could be considerably different depending upon the coverage required, although semantically we would want to test both approaches with a minimum number of tests. [citation needed] Another example that could be considered as "cheating" to achieve higher MC/DC is:
Locks typically require hardware support for efficient implementation. This support usually takes the form of one or more atomic instructions such as "test-and-set", "fetch-and-add" or "compare-and-swap". These instructions allow a single process to test if the lock is free, and if free, acquire the lock in a single atomic operation.