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  2. Humidity - Wikipedia

    en.wikipedia.org/wiki/Humidity

    The optimal humidity for electronic devices is 30% to 65%. At the top end of the range, moisture may increase the conductivity of permeable insulators leading to malfunction. Too low humidity may make materials brittle. A particular danger to electronic items, regardless of the stated operating humidity range, is condensation.

  3. Moisture sensitivity level - Wikipedia

    en.wikipedia.org/wiki/Moisture_sensitivity_level

    It relates to the packaging and handling precautions for some semiconductors. The MSL is an electronic standard for the time period in which a moisture sensitive device can be exposed to ambient room conditions (30 °C/85%RH at Level 1; 30 °C/60%RH at all other levels). Increasingly, semiconductors have been manufactured in smaller sizes.

  4. Operating temperature - Wikipedia

    en.wikipedia.org/wiki/Operating_temperature

    An operating temperature is the allowable temperature range of the local ambient environment at which an electrical or mechanical device operates. The device will operate effectively within a specified temperature range which varies based on the device function and application context, and ranges from the minimum operating temperature to the maximum operating temperature (or peak operating ...

  5. Hygrometer - Wikipedia

    en.wikipedia.org/wiki/Hygrometer

    A hygrometer is an instrument which measures the humidity of air or some other gas: that is, how much of it is water vapor. [1] Humidity measurement instruments usually rely on measurements of some other quantities such as temperature, pressure, mass, and mechanical or electrical changes in a substance as moisture is absorbed.

  6. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    Humidity and aggressive chemicals can cause corrosion of the packaging materials and leads, potentially breaking them and damaging the inside parts, leading to electrical failure. Exceeding the allowed environmental temperature range can cause overstressing of wire bonds, thus tearing the connections loose, cracking the semiconductor dies, or ...

  7. Highly accelerated stress test - Wikipedia

    en.wikipedia.org/wiki/Highly_accelerated_stress_test

    The highly accelerated stress test (HAST) method was first proposed by Jeffrey E. Gunn, Sushil K. Malik, and Purabi M. Mazumdar of IBM. [1]The acceleration factor for elevated humidity is empirically derived to be