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An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing them to produce magnified images or electron diffraction patterns.
The company of Carl Zeiss exploited this discovery and becomes the dominant microscope manufacturer of its era. 1928: Edward Hutchinson Synge publishes theory underlying the near-field scanning optical microscope; 1931: Max Knoll and Ernst Ruska start to build the first electron microscope. It is a transmission electron microscope (TEM).
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
Scanning electron microscope image of pollen (false colors) Microscopic examination in a biochemical laboratory. Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). [1]
First commercial Electron microscope, constructed by Ernst Ruska in 1939. Ernst August Friedrich Ruska (German pronunciation: [ɛʁnst ˈʁʊskaː] ⓘ; 25 December 1906 – 27 May 1988) [1] was a German physicist who won the Nobel Prize in Physics in 1986 for his work in electron optics, including the design of the first electron microscope.
Born in Brantford, Ontario, the son of James and Ethel (Cooke) Hillier, he received a Bachelor of Arts in Mathematics and Physics (1937), Master of Arts (1938), and a Ph.D (1941) from the University of Toronto, where, as a graduate student, he completed a prototype of the electron microscope that had been invented by Ernst Ruska.
JEOL, Ltd. (日本電子, Nihon Denshi Kabushiki-kaisha, Nihon meaning Japan and Denshi meaning electron) is a major developer and manufacturer of electron microscopes and other scientific instruments, industrial equipment and medical equipment.
Thus he believed that real magnified images could be obtained under these conditions. As the date of a public lecture on electron optics was approaching Siemens applied for a patent on Rudenberg's electrostatic-lens instrument and his general electron microscope principles on May 30, 1931. Siemens also obtained patents in six other countries.