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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    M. von Ardenne's. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

  3. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    Inside the aberration corrector (hexapole -hexapole type) A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen.

  4. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    The polio virus is 30 nm in diameter. [1] Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons ...

  5. Electron microprobe - Wikipedia

    en.wikipedia.org/wiki/Electron_microprobe

    An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam ...

  6. Data engineering - Wikipedia

    en.wikipedia.org/wiki/Data_engineering

    Around the 1970s/1980s the term information engineering methodology (IEM) was created to describe database design and the use of software for data analysis and processing. [3] [4] These techniques were intended to be used by database administrators (DBAs) and by systems analysts based upon an understanding of the operational processing needs of organizations for the 1980s.

  7. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera.

  8. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution image of magnesium sample. High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [1][2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals ...

  9. 4D scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/4D_scanning_transmission...

    4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...

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