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  2. Counts per minute - Wikipedia

    en.wikipedia.org/wiki/Counts_per_minute

    The count rates of cps and cpm are generally accepted and convenient practical rate measurements. They are not SI units, but are de facto radiological units of measure in widespread use. Counts per minute (abbreviated to cpm) is a measure of the detection rate of ionization events per minute.

  3. Program evaluation and review technique - Wikipedia

    en.wikipedia.org/wiki/Program_Evaluation_and...

    Activities that are on the critical path have a slack of zero (0). The duration of path adf is 14.83 work days. The duration of path aceg is 19.51 work days. The duration of path beg is 15.67 work days. The critical path is aceg and the critical time is 19.51 work days. It is important to note that there can be more than one critical path (in a ...

  4. Critical path method - Wikipedia

    en.wikipedia.org/wiki/Critical_path_method

    The critical path method (CPM), or critical path analysis (CPA), is an algorithm for scheduling a set of project activities. [1] A critical path is determined by identifying the longest stretch of dependent activities and measuring the time [ 2 ] required to complete them from start to finish.

  5. Critical path drag - Wikipedia

    en.wikipedia.org/wiki/Critical_path_drag

    Critical path drag is a project management metric [1] developed by Stephen Devaux as part of the Total Project Control (TPC) approach to schedule analysis and compression [2] in the critical path method of scheduling. Critical path drag is the amount of time that an activity or constraint on the critical path is adding to the project duration.

  6. CPM - Wikipedia

    en.wikipedia.org/wiki/CPM

    Carboxypeptidase M, an enzyme; Cellular Potts model, a computer simulation of cellular structures; Central pontine myelinolysis, a neurological disease; Certified Professional Midwife, a direct-entry midwife certification

  7. Process capability index - Wikipedia

    en.wikipedia.org/wiki/Process_capability_index

    If the upper and lower specification limits of the process are USL and LSL, the target process mean is T, the estimated mean of the process is ^ and the estimated variability of the process (expressed as a standard deviation) is ^, then commonly accepted process capability indices include:

  8. Wipe test counter - Wikipedia

    en.wikipedia.org/wiki/Wipe_test_counter

    A wipe test counter is a device used to measure for possible radioactive contamination in a variety of environments. When using radioactive materials it is necessary to test for accidental contamination, whether from use of liquid unsealed sources or to check for leaking sealed sources.

  9. Delay calculation - Wikipedia

    en.wikipedia.org/wiki/Delay_calculation

    Delay calculation is the term used in integrated circuit design for the calculation of the gate delay of a single logic gate and the wires attached to it. By contrast, static timing analysis computes the delays of entire paths, using delay calculation to determine the delay of each gate and wire.