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A Bernal chart (bər′nal ′chärt) in crystallography, is a chart used for indexing X-ray diffraction photographs from single crystals. From such a chart may be read the axial and radial cylindrical coordinates of that point in reciprocal space which corresponds to any particular X-ray reflection. [1]
In crystallography, a Greninger chart [1] / ˈ ɡ r ɛ n ɪ ŋ ər / is a chart that allows angular relations between zones and planes in a crystal to be directly read from an x-ray diffraction photograph. The Greninger chart is a simple trigonometric tool to determine g and d for a fixed sample-to-film distance. (If one uses a 2-d detector the ...
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
CNS is an extension of X-PLOR released in 1987, [226] and is used for solving structures based on X-ray diffraction or solution NMR data. [ 227 ] 1994 - Jan Pieter Abrahams et al. reported the structure of an F1- ATPase which uses the proton-motive force across the inner mitochondrial membrane to facilitate the synthesis of adenosine ...
An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
X-ray powder diffraction fingerprinting has become the standard tool for the identification of single or multiple crystal phases and is widely used in such fields as metallurgy, mineralogy, forensic science, archeology, condensed matter physics, and the biological and pharmaceutical sciences.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.