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  2. Bright-field microscopy - Wikipedia

    en.wikipedia.org/wiki/Bright-field_microscopy

    Bright-field microscopy (BF) is the simplest of all the optical microscopy illumination techniques. Sample illumination is transmitted (i.e., illuminated from below and observed from above) white light , and contrast in the sample is caused by attenuation of the transmitted light in dense areas of the sample.

  3. Low-energy electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Low-energy_electron_microscopy

    A particular application of bright field spectroscopy is the counting of the exact number of layers in layered materials such as (few layer) graphene, hexagonal boron nitride and some transition metal dichalcogenides. [4] [5] [6] Photoexcitation electron microscopy (PEEM) of Ag rods on Si.

  4. Negative stain - Wikipedia

    en.wikipedia.org/wiki/Negative_stain

    For bright-field microscopy, negative staining is typically performed using a black ink fluid such as nigrosin and India ink.The specimen, such as a wet bacterial culture spread on a glass slide, is mixed with the negative stain and allowed to dry.

  5. Microscopy - Wikipedia

    en.wikipedia.org/wiki/Microscopy

    Bright field microscopy is the simplest of all the light microscopy techniques. Sample illumination is via transmitted white light, i.e. illuminated from below and observed from above. Limitations include low contrast of most biological samples and low apparent resolution due to the blur of out-of-focus material.

  6. Transillumination - Wikipedia

    en.wikipedia.org/wiki/Transillumination

    In microscopy transillumination refers to the illumination of a sample by transmitted light. In its most basic form it generates a bright field image, and is commonly used with transillumination techniques such as phase contrast and differential interference contrast microscopy.

  7. 4D scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/4D_scanning_transmission...

    It is also possible for there to be a(n) ADF or HAADF image taken concurrently with the CBED pattern collection, depending on where the detector is located on the microscope. An annular dark-field image taken may be complementary to a bright-field image constructed from the captured CBED images.