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  2. Soft error - Wikipedia

    en.wikipedia.org/wiki/Soft_error

    Main page; Contents; Current events; Random article; About Wikipedia; Contact us; Help; Learn to edit; Community portal; Recent changes; Upload file

  3. Realtek - Wikipedia

    en.wikipedia.org/wiki/Realtek

    Avance Logic was acquired by Realtek as early as 1995 and was an independent subsidiary until the end of 2002, when the company was integrated into Realtek. Realtek's Audio Solutions are based on Avance Logic technology, which can also be recognized by the prefixes "ALG" (Avance Logic Graphics) and "ALS" (Avance Logic Sound).

  4. Semiconductor fault diagnostics - Wikipedia

    en.wikipedia.org/wiki/Semiconductor_fault...

    The input to a fault diagnostic is a tester datalog showing the failure characteristics of the device. The diagnostic algorithm uses an internal simulation of a fault model of the electrical circuit in order to compare the failure characteristics of the actual device with a set of simulated failure characteristics.

  5. Pentium FDIV bug - Wikipedia

    en.wikipedia.org/wiki/Pentium_FDIV_bug

    Thomas Nicely, a professor of mathematics at Lynchburg College, had written code to enumerate primes, twin primes, prime triplets, and prime quadruplets.Nicely noticed some inconsistencies in the calculations on June 13, 1994, shortly after adding a Pentium system to his group of computers, but was unable to eliminate other factors (such as programming errors, motherboard chipsets, etc.) until ...

  6. Single-event upset - Wikipedia

    en.wikipedia.org/wiki/Single-event_upset

    Single-event upsets were first described during above-ground nuclear testing, from 1954 to 1957, when many anomalies were observed in electronic monitoring equipment.. Further problems were observed in space electronics during the 1960s, although it was difficult to separate soft failures from other forms of interfe

  7. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  8. Low-voltage differential signaling - Wikipedia

    en.wikipedia.org/wiki/Low-voltage_differential...

    In 1994, National Semiconductor introduced LVDS, which later became a de facto standard for high-speed data transfer. [2]: 8 Doestek 34LM85AM, used in a tablet as flat panel display transmitter. LVDS became popular in the mid 1990s. Before that, computer monitor resolutions were not large enough to need such fast data rates for graphics and video.

  9. EEPROM - Wikipedia

    en.wikipedia.org/wiki/EEPROM

    The first EEPROM that used Fowler-Nordheim tunnelling to erase data was invented by Bernward and patented by Siemens in 1974. [24] In February 1977, Israeli-American Eliyahou Harari at Hughes Aircraft Company patented in the US a modern EEPROM technology, based on Fowler-Nordheim tunnelling through a thin silicon dioxide layer between the floating-gate and the wafer.