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A bright-field microscope has many important parts including; the condenser, the objective lens, the ocular lens, the diaphragm, and the aperture. Some other pieces of the microscope that are commonly known are the arm, the head, the illuminator, the base, the stage, the adjusters, and the brightness adjuster.
The interpretation of dark-field images must be done with great care, as common dark features of bright-field microscopy images may be invisible, and vice versa. In general the dark-field image lacks the low spatial frequencies associated with the bright-field image, making the image a high-passed version of the underlying structure.
Bright Field imaging uses the specular, reflected, (0,0) beam to form an image. Also known as phase or interference contrast imaging, bright field imaging makes particular use of the wave nature of the electron to generate vertical diffraction contrast, making steps on the surface visible.
The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and ...
This eliminates a typical weaknesses in conventional STEM operation as STEM bright-field and dark-field detectors are placed at fixed angles and cannot be changed during imaging. [27] With a 4D dataset bright/dark-field images can be obtained by integrating diffraction intensities from diffracted and transmitted beams respectively. [25]
WBDF is often used in tandem with other TEM imaging techniques such as bright field (BF) and dark field (DF) imaging. These frequently used techniques similarly create an image from electrons that pass through and interact with the sample, however, the difference lies in the electrons which are selected to fall on the detector, and the degree ...
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