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  2. Bruker Releases AFM Zoom Option for 3D Optical Microscopes - AOL

    www.aol.com/2012/11/26/bruker-releases-afm-zoom...

    Bruker Releases AFM Zoom Option for 3D Optical Microscopes NanoLens™ Accessory Expands Power of ContourGT Systems BOSTON--(BUSINESS WIRE)-- Bruker announced today at the 2012 Materials Research ...

  3. NanoAndMore - Wikipedia

    en.wikipedia.org/wiki/NanoAndMore

    AFM probes sold by NanoAndMore fit all common Atomic Force Microscopes (AFM) like Asylum Research, Bruker, JPK, Molecular Imaging, Nanosurf, Veeco, WiTEK, NTMDT, Novascan, etc. As an important distributor of AFM probes it is often cited as a supplier in research papers and is therefore considered an important source of products for Atomic Force ...

  4. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    The conventional PFM operates in contact mode in which the AFM tip is in contact with the sample during the scanning. Contact mode is not suitable for samples with features susceptible to damage or displacement by the tip's drag. In Pin Point PFM, the AFM tip does not contact the surface.

  5. Nanoprobing - Wikipedia

    en.wikipedia.org/wiki/Nanoprobing

    Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor industry. The characterization of individual devices is instrumental to engineers and integrated circuit designers during initial product development and debug.

  6. UK National Graphene Institute Selects Bruker's Dimension ...

    www.aol.com/2013/04/02/uk-national-graphene...

    UK National Graphene Institute Selects Bruker's Dimension FastScan AFM New Levels of Speed, Ease of Use, and Productivity Enable Next-Generation Applications SANTA BARBARA, Calif.--(BUSINESS WIRE ...

  7. Bruker Introduces New AFM Semiconductor ... - AOL

    www.aol.com/news/2013-04-04-bruker-introduces...

    Bruker Introduces New AFM Semiconductor Characterization Solution Highest Resolution Carrier Profiling Capability Confirmed by Imec SANTA BARBARA, Calif.--(BUSINESS WIRE)-- Bruker announced today ...

  8. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  9. Dip-pen nanolithography - Wikipedia

    en.wikipedia.org/wiki/Dip-Pen_Nanolithography

    Dip pen nanolithography (DPN) is a scanning probe lithography technique where an atomic force microscope (AFM) tip is used to directly create patterns on a substrate. [1] It can be done on a range of substances with a variety of inks. A common example of this technique is exemplified by the use of alkane thiolates to imprint onto a gold surface ...

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