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Bruker Releases AFM Zoom Option for 3D Optical Microscopes NanoLens™ Accessory Expands Power of ContourGT Systems BOSTON--(BUSINESS WIRE)-- Bruker announced today at the 2012 Materials Research ...
Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20 μm × 20 μm × 420 nm). The AFM can be operated in a number of modes, depending on the application.
AFM probes sold by NanoAndMore fit all common Atomic Force Microscopes (AFM) like Asylum Research, Bruker, JPK, Molecular Imaging, Nanosurf, Veeco, WiTEK, NTMDT, Novascan, etc. As an important distributor of AFM probes it is often cited as a supplier in research papers and is therefore considered an important source of products for Atomic Force ...
Bruker Corporation is an American manufacturer of scientific instruments for molecular and materials research, as well as for industrial and applied analysis. It is headquartered in Billerica, Massachusetts, and is the publicly traded parent company of Bruker Scientific Instruments (Bruker AXS, Bruker BioSpin, Bruker Daltonics and Bruker Optics) and Bruker Energy & Supercon Technologies (BEST ...
Bruker Introduces New AFM Semiconductor Characterization Solution Highest Resolution Carrier Profiling Capability Confirmed by Imec SANTA BARBARA, Calif.--(BUSINESS WIRE)-- Bruker announced today ...
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Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
The colloidal probe consists of a colloidal particle of few micrometers in diameter that is attached to an AFM cantilever. The colloidal probe technique can be used in the sphere-plane or sphere-sphere geometries (see figure). One typically achieves a force resolution between 1 and 100 pN and a distance resolution between 0.5 and 2 nm.
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