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A twin boundary is a defect that introduces a plane of mirror symmetry in the ordering of a crystal. For example, in cubic close-packed crystals, the stacking sequence of a twin boundary would be ABCABCBACBA. On planes of single crystals, steps between atomically flat terraces can also be regarded as planar defects.
Although the criterion for deformation twin growth is not entirely understood, it is a tip-controlled phenomenon linked to the interaction between the residual and mobile twin partials at the twin interface; thermodynamically, this involves the elastic energy of the strained lattice, the interface and volume free-energy of the twin, and the ...
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In a TEM, bright field imaging is one technique used to identify the location of stacking faults. Typical image of stacking fault is dark with bright fringes near a low-angle grain boundary, sandwiched by dislocations at the end of the stacking fault. Fringes indicate that the stacking fault is at an incline with respect to the viewing plane. [3]
An electron backscatter diffraction pattern of monocrystalline silicon, taken at 20 kV with a field-emission electron source. Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials.
Some of the model-based FDI techniques include [2] observer-based approach, parity-space approach, and parameter identification based methods. There is another trend of model-based FDI schemes, which is called set-membership methods. These methods guarantee the detection of fault under certain conditions.
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Black-box testing, sometimes referred to as specification-based testing, [1] is a method of software testing that examines the functionality of an application without peering into its internal structures or workings. This method of test can be applied virtually to every level of software testing: unit, integration, system and acceptance.