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  2. Crystallographic defect - Wikipedia

    en.wikipedia.org/wiki/Crystallographic_defect

    A twin boundary is a defect that introduces a plane of mirror symmetry in the ordering of a crystal. For example, in cubic close-packed crystals, the stacking sequence of a twin boundary would be ABCABCBACBA. On planes of single crystals, steps between atomically flat terraces can also be regarded as planar defects.

  3. Crystal twinning - Wikipedia

    en.wikipedia.org/wiki/Crystal_twinning

    Although the criterion for deformation twin growth is not entirely understood, it is a tip-controlled phenomenon linked to the interaction between the residual and mobile twin partials at the twin interface; thermodynamically, this involves the elastic energy of the strained lattice, the interface and volume free-energy of the twin, and the ...

  4. Sustained load cracking - Wikipedia

    en.wikipedia.org/wiki/Sustained_load_cracking

    The cracks are intergranular and occur at grain boundaries. There is no evidence of stress corrosion or fatigue. [1] [5] The presence of a relatively high lead content has been identified as a contributory factor. Cracking at the grain boundaries is accelerated in the presence of lead. The presence of bismuth is also suspected to be ...

  5. Crystal - Wikipedia

    en.wikipedia.org/wiki/Crystal

    Twinning is a phenomenon somewhere between a crystallographic defect and a grain boundary. Like a grain boundary, a twin boundary has different crystal orientations on its two sides. But unlike a grain boundary, the orientations are not random, but related in a specific, mirror-image way. Mosaicity is a spread of crystal plane orientations.

  6. Anomaly detection - Wikipedia

    en.wikipedia.org/wiki/Anomaly_detection

    Garbe et al. [19] have introduced a multi-stage anomaly detection framework that improves upon traditional methods by incorporating spatial clustering, density-based clustering, and locality-sensitive hashing. This tailored approach is designed to better handle the vast and varied nature of IoT data, thereby enhancing security and operational ...

  7. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    An electron backscatter diffraction pattern of monocrystalline silicon, taken at 20 kV with a field-emission electron source. Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials.

  8. Method of images - Wikipedia

    en.wikipedia.org/wiki/Method_of_images

    The method of images (or method of mirror images) is a mathematical tool for solving differential equations, in which boundary conditions are satisfied by combining a solution not restricted by the boundary conditions with its possibly weighted mirror image. Generally, original singularities are inside the domain of interest but the function is ...

  9. Fault detection and isolation - Wikipedia

    en.wikipedia.org/wiki/Fault_detection_and_isolation

    Some of the model-based FDI techniques include [2] observer-based approach, parity-space approach, and parameter identification based methods. There is another trend of model-based FDI schemes, which is called set-membership methods. These methods guarantee the detection of fault under certain conditions.