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  2. TMI Group of Companies - Wikipedia

    en.wikipedia.org/wiki/TMI_Group_of_Companies

    The TMI Group of Companies is a multi-national organization that manufactures and markets physical property testing instruments for the packaging, paper, pulp, plastic film, foil, ink, coatings, nonwoven, textile, adhesives, and corrugated industries.

  3. Fluke Corporation - Wikipedia

    en.wikipedia.org/wiki/Fluke_Corporation

    Pomona Electronics is a company specializing in electronic test equipment and accessories. It was founded in 1951 by Joseph J. and Carl W. Musarra, who were brothers. [7] [8] Founded to manufacture test cable harnesses for examining television cathode-ray tubes. [9] the company started in a factory location around the size of a living room. [9]

  4. HCT Co., Ltd. - Wikipedia

    en.wikipedia.org/wiki/HCT_Co.,_Ltd.

    HCT Co., Ltd. is a South Korean compliance testing and equipment calibration company that also develops particle counters and antennas. Founded in 2000 as Hyundai Calibration & Certification Technologies Co., the company is a spin-off from Hyundai Electronics, the world's second-largest memory chipmaker.

  5. Category:Electronic test equipment manufacturers - Wikipedia

    en.wikipedia.org/wiki/Category:Electronic_test...

    Pages in category "Electronic test equipment manufacturers" The following 38 pages are in this category, out of 38 total. This list may not reflect recent changes. A.

  6. Teradyne - Wikipedia

    en.wikipedia.org/wiki/Teradyne

    The Semiconductor Test Division provides test equipment used by integrated circuit manufacturers to test logic, RF, analog, power, mixed-signal and memory devices. Teradyne manufactures five principal families of testers known as the "J750", "FLEX," "UltraFLEX," “Eagle” and “Magnum” series.

  7. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

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